Electronic Systems Group (GSE)

Publications in journals

  • Teva, J.; Abadal, G.; Torres, F.; Verd, J.; Pérez-Murano, F. i Barniol, N., "A femtogram resolution mass sensor platform, based on SOI electrostatically driven resonant cantilever. Part II: sensor calibration and glycerine evaporation rate measurement", "Ultramicroscopy", Volume 106, Issue 8-9, Pages 808-814, 2006. Paper.
  • Gómez, J.M.; Bota, S.A.; Marco, S.; Samitier, J, "Force-balance interface circuit based on floating MOSFET capacitors for micro-machined capacitive accelerometers", "Ieee Transactions On Circuits And Systems Ii-Express Briefs", Volume 53, Issue 7, Pages 546-552, 2006. Paper.
  • Verd, J.; Uranga, A.; Teva, J.; López, J.L.; Torres, F.; Esteve, J.; Abadal, G.; Pérez-Murano, F. i Barniol, N., "Integrated CMOS-MEMS with On-Chip Readout Electronics for High-Frequency Applications", "IEEE Electron Device Letters", Volume 27, Issue 6, Pages 495-497, 2006. Paper.
  • Villarroya, M.; Verd, J.; Teva, J.; Abadal, G.; Forsen, E.; Pérez-Murano, F.; Uranga, A.; Figueras, E.; Montserrat, J.; Esteve, J.; Boisen, A. i Barniol, N., "System on chip mass sensor based on polysilicon cantilevers arrays for multiple detection", "Sensors and Actuators A-Physical", Volume 132, Pages 154-164, 2006. Paper.
  • Villarroya, M.; Figueras, E.; Verd, J.; Teva, J.; Abadal, G.; Pérez-Murano, F.; Montserrat, J.; Uranga, A.; Esteve, J. and Barniol, N., "CMOS-SOI platform for the monolithical integration of crystalline silicon MEMS", "Electronics Letters", Volume 42, Issue 14, Pages 800-801, 2006. Paper.
  • Villarroya, M.; Figueras, E.; Montserrat, J.; Verd, J.; Teva, J.; Abadal, G.; Pérez-Murano, F.; Esteve, J. and Barniol, N., "A platform for monolithic CMOS-MEMS integration on SOI wafers", "Journal of Micromechanics and Microengineering", Volume 16, Pages 2203-2210, 2006. Paper.
  • Bota, S.A.; Rosselló, J.; de Benito, C; Keshavarzi, A.; Segura, J., "Impact of thermal gradients on clock skew and testing", "IEEE Design & Test of Computers", Volume 23, Issue 5, Pages 414-424, 2006. Paper.
  • Rosselló, J.; de Benito, C.;Bota, S.A.; Segura, J., "Leakage Power Characterization considering process variations", "Lecture Notes in Computer Science", Volume 4148, Pages 66-74, 2006. Paper.
  • Teva, J.; Abadal, G.; Torres, F.; Verd, J.; Pérez-Murano, F. i Barniol, N., "A femtogram resolution mass sensor platform, based on SOI electrostatically driven resonant cantilever. Part I: electromechanical model and parameter extraction", "Ultramicroscopy", Volume 106, Issue 8-9, Pages 800-807, 2006. Paper.