Electronic Engineering Group (GEE)

Publications in journals

  • Torrens, G.; Alorda, B.; Barcelo, S.; Rossello, J.L.; Bota, S.A.; Segura, J, "Design Hardening of Nanometer SRAMs Through Transistor Width Modulation and Multi-Vt Combination", "Ieee Transactions On Circuits And Systems Ii-Express Briefs", Volume 57, Issue 4, Pages 280-284, 2010. Paper.
  • Canals, V.; Morro, A.; Rossello, J.L., "Stochastic-Based Pattern Recognition Analysis", "Pattern Recognition Letters", Volume 31, Issue 15, Pages 2353-2356, 2010. Paper.
  • Estrada, M.; Cerdeira, A.; Mejia, I.; Avila, M.; Picos, R.; Marsal, L.F.; Pallares, J.; Iñiguez, B., "Modeling the behavior of charge carrier mobility with temperature in thin-film polymeric transistors", "Microelectronic Engineering", Volume 87, Issue 12, Pages 2565-2570, 2010. Paper.
  • Suenaga, K.; Isern, E.; Picos, R.; Bota, S.; Roca, M.; Garcia-Moreno, E, "Application of Predictive Oscillation-Based Test to a CMOS OpAmp", "IEEE Transactions on Instrumentation and Measurement", Volume 59, Issue 8, Pages 2076-2082, 2010. Paper.