Electronic Engineering Group (GEE)
- V. Apkarian, M. Baliki, Y. Sosa, R. N. Harden, R. Levy, O. Calvo, D. Chialvo. , "Nonlinear analysis of ratings of spontaneous fluctuations of pain in chronic back pain may have diagnostic Value". "American Pain Society", Chicago, United States, 2003. Paper presentation.
- Picos, R.; Font, J.; Isern, E.; Roca, M.; Garcia, E.. , "A configurable built in current sensor for mixed signal circuit testing". "9th IEEE International On-Line Testing Symposium, IOLTS 2003.", Kos Island, Greece, 2003. Publication data: Proceedings of the 9th IEEE IOLTS 2003. Poster.